STUDENT SEMINAR
By
VIVEK NAGENDRA BHAT
Topic: Broadband Near-field Optical Spectroscopy
Date & Time: January 20, 2022 at 4.00 p.m. through MICROSOFT TEAMS
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Abstract:
The spatial resolution in optical microscopy is limited by the diffraction-limited spot. Several super-resolution microscopy methods exist. However, most are not amenable to use with broadband femto second lasers. I will discuss a recent variant of Scanning Near-field Optical Microscopy (SNOM) which makes it possible to achieve spatial resolution beyond the diffraction limit, easily couples to broadband light, and makes signal detection against a large background feasible. This new approach relies on an “in-line interferometer” which provides better signal-to-noise and stability compared to existing SNOM approaches. I will present the experimental aspects in detail and briefly mention a recent application of this approach to characterize the local density of states in Sb2S3nanodots.
References:
[1] Paul Bazylewski, Sabastine Ezugwu, Giovanni Fanchini, Appl. Sci. 2017, vol. 7, 973.
[2] Lukas Novotny and Stephan J. Stranick, Annu. Rev. Phys. Chem. 2006,vol. 57, 303.
[3] Jens Brauer, Jinxin Zhan, Abbas Chimeh, Anke Korte, Christoph Lienau, Petra Gross, Optics Express 2017, vol. 25, 15505.
[4] Jinxin Zhan, Wei Wang, Jens Brauer, Lukas Schmidt-Mende, Christoph Lienau, Petra Gross, Advanced Photonics, 2020, vol. 2, 046004.