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STUDENT SEMINAR  

By  

VIVEK NAGENDRA BHAT  

 

Topic:   Broadband Near-field Optical Spectroscopy 

Date & Time: January 20, 2022 at 4.00 p.m.  through MICROSOFT TEAMS 

 

Microsoft Teams Link:
https://teams.microsoft.com/l/meetup-join/19%3a95b3dfced9714083b3ea8ab65a1c6082%40thread.tacv2/1642488918530?context=%7b%22Tid%22%3a%226f15cd97-f6a7-41e3-b2c5-ad4193976476%22%2c%22Oid%22%3a%22d64531be-ed78-4889-964f-310c77d866d8%22%7d

 

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Abstract:

The spatial resolution in optical microscopy is limited by the diffraction-limited spot. Several super-resolution microscopy methods exist. However, most are not amenable to use with broadband  femto second lasers. I will discuss a recent variant of Scanning Near-field Optical Microscopy (SNOM) which makes it possible to achieve spatial resolution beyond the diffraction limit, easily couples to broadband light, and makes signal detection against a large background feasible. This new approach relies on an “in-line interferometer” which provides better signal-to-noise and stability compared to existing SNOM approaches. I will present the experimental aspects in detail and briefly mention a recent application of this approach to characterize the local density of states in Sb2S3nanodots.

 

References:

[1] Paul Bazylewski,  Sabastine  Ezugwu, Giovanni Fanchini, Appl. Sci. 2017, vol. 7, 973.

[2] Lukas Novotny and Stephan J. Stranick,  Annu.  Rev. Phys. Chem. 2006,vol. 57, 303.

[3] Jens Brauer,  Jinxin Zhan, Abbas  Chimeh,  Anke  Korte, Christoph  Lienau, Petra Gross, Optics Express 2017, vol. 25, 15505.

[4] Jinxin  Zhan, Wei Wang, Jens Brauer, Lukas Schmidt-Mende,  Christoph  Lienau, Petra Gross,  Advanced Photonics, 2020, vol. 2, 046004.