Topic:   Broadband Near-field Optical Spectroscopy 

Date & Time: January 20, 2022 at 4.00 p.m.  through MICROSOFT TEAMS 


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The spatial resolution in optical microscopy is limited by the diffraction-limited spot. Several super-resolution microscopy methods exist. However, most are not amenable to use with broadband  femto second lasers. I will discuss a recent variant of Scanning Near-field Optical Microscopy (SNOM) which makes it possible to achieve spatial resolution beyond the diffraction limit, easily couples to broadband light, and makes signal detection against a large background feasible. This new approach relies on an “in-line interferometer” which provides better signal-to-noise and stability compared to existing SNOM approaches. I will present the experimental aspects in detail and briefly mention a recent application of this approach to characterize the local density of states in Sb2S3nanodots.



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